I. Instrument Applications
This instrument is capable of performing phase identification and quantitative phase analysis of polycrystalline samples, line profile analysis using the fundamental parameters approach, unit cell parameter calculation and solid solution analysis, structural refinement, and structure solution; grazing-incidence diffraction measurements of thin films; determination of thin film thickness, density, and roughness via reflectivity measurements; analysis of crystalline perfection of single crystals and single-crystal epitaxial thin films, as well as determination of composition, relaxation degree, and other parameters of epitaxial thin films. The system is also equipped with an in-situ high-temperature stage and an in-situ battery structure testing system.
II.Key Technical Specifications
1. X-ray tube type: Ceramic X-ray tube, Cu target; maximum X-ray tube power: ≥ 2.2 kW.
2. Diffraction optical path system:
Automatic slit system: adjustment range not less than 5 mm;
Monochromator: resolution ≤ 20 arcsec;
The automatic slits and monochromator are integrated into a single computer-controlled system with automatic switching, requiring no manual replacement.
3. Sample stages:
High-precision Eulerian cradle sample stage: PHI, CHI, and Z axes are fully motorized and automatically controlled. It can simultaneously accommodate conventional powder sample analysis, thin film analysis, texture analysis, stress analysis, and micro-area analysis without the need to change sample stages.
Standard sample stage: can accommodate samples with thickness > 18 mm and diameter ≥ 50 mm.
High-temperature in-situ analysis accessory: Temperature range: room temperature to 1200°C; operable under vacuum, inert atmosphere, or ambient atmosphere.
Battery in-situ analysis accessory: Battery in-situ analysis accessory with charge/discharge and heating/cooling functions; temperature range of the battery in-situ analysis accessory: −30°C to +80°C.
III. Booking Instructions
Sample submission for testing, or independent operation after passing training and assessment.
IV. Sample Requirements
1. Toxic or corrosive samples will not be tested;
2. Samples may be in powder form, bulk form, or other shapes; bulk samples must have a clean and flat testing surface.
